第五周碩博專討演講公告(10/14)
2021.10.14
碩博專討演講公告
題目:
應用X光奈米探測光束線探索奈米世界與材料科學
Explore the nanoworld and material science using an X-ray nanoprobe beamline
主講人:曾紹欽 博士 (Tseng Shao-Chin)
現職:國家同步輻射中心 實驗設施組/X光影像小組 助研究員
內容摘要:
Introduction to fundamental and technic aspects of the particularity of Taiwan Photon Source and apply X-ray nanoprobe to scientific research. In this talk, that will show some experimental cases like the X-ray fluorescence spectroscopy (for the analysis in the depth-of-field distribution of elements), extended X-ray absorption spectroscopy (for the analysis in the electronic configuration and the atomic or molecular bonding length), excitation X-ray fluorescence spectroscopy (for the analysis in the recombination and transport of carriers), in-phase scanning X-ray imageology (the Fourier phase transform calculation can improve the space resolution down to 3nm to 5nm, and detect the stress distribution inside the nanostructures). In addition, an in situ electrical testing system with 13 channels has also been developed. It can be used for in-situ measurement of the properties of semiconductor and optoelectronic devices when they are under operation.
時間:民國110年10月14日 星期四
地點:moodle上觀看線上影片及成功大學成功校區三系館鋼構區(3F)共同教室 A1302演講廳
歡迎參加!!
歡迎參加!!
題目:
應用X光奈米探測光束線探索奈米世界與材料科學
Explore the nanoworld and material science using an X-ray nanoprobe beamline
主講人:曾紹欽 博士 (Tseng Shao-Chin)
現職:國家同步輻射中心 實驗設施組/X光影像小組 助研究員
內容摘要:
Introduction to fundamental and technic aspects of the particularity of Taiwan Photon Source and apply X-ray nanoprobe to scientific research. In this talk, that will show some experimental cases like the X-ray fluorescence spectroscopy (for the analysis in the depth-of-field distribution of elements), extended X-ray absorption spectroscopy (for the analysis in the electronic configuration and the atomic or molecular bonding length), excitation X-ray fluorescence spectroscopy (for the analysis in the recombination and transport of carriers), in-phase scanning X-ray imageology (the Fourier phase transform calculation can improve the space resolution down to 3nm to 5nm, and detect the stress distribution inside the nanostructures). In addition, an in situ electrical testing system with 13 channels has also been developed. It can be used for in-situ measurement of the properties of semiconductor and optoelectronic devices when they are under operation.
時間:民國110年10月14日 星期四
地點:moodle上觀看線上影片及成功大學成功校區三系館鋼構區(3F)共同教室 A1302演講廳
歡迎參加!!
歡迎參加!!