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115學年材料系-第七週 專題研討課程 演講公告 (115年4月16日)

2026.04.14

115學年材料系-第七週 專題研討課程 演講公告 (115年4月16日)

題目:成大核心設施中心儀器及服務介紹-貴重儀器設備組:一般與尖端服務


講者:朱紋慧/洪慈蓮/李民楷
 博士
現職:國立成功大學 核心設施中心 博士後研究員

時間:4/16 (四) 15:20~17:10
地點:成功大學 成功校區 三系館 鋼構區 (3F) 共同教室 A1302 演講廳 

內容摘要:

The Instrument Division of Core Facility Center, formerly known as the NSTC Instrument Center at NCKU, operates a diverse range of instruments. These include various low temperature and high-magnetic field systems, Nuclear Magnetic Resonance (NMR) spectrometers, Mass Spectrometers (MS), X-ray Photoelectron Spectrometers (XPS), X-ray Diffractometers (XRD), and both Scanning and Transmission Electron Microscopes (SEM/TEM). These large instruments enable high-level analysis of various materials, covering chemical structures, crystalline lattices, surface morphology, elemental composition, magnetic behavior, and various types of phase transitions.
In addition to the fundamental measurement service including case studies, this introduction also promotes our advance services, such as:
       In-situ Transmission Electron Microscopy (In-situ TEM)
       AFM-based Scanning Electrochemical Microscopy (SECM)
       High-Pressure Single-Crystal X-ray Diffraction
In-situ TEM excels at capturing high-resolution images and real-time video of dynamic events, providing invaluable insights into structural changes during electrochemical reactions. On the other hand, AFM-based SECM offers the direct observation of electrochemical activity correlated with surface morphology, revealing sub-micron spatial resolution. For researchers investigating lattice parameter variations and phase transitions within a pressure range of 10 GPa, the High-Pressure Single-Crystal X-ray Diffractometer provides precise structural characterization, including the analysis of atomic positions, bond lengths, and bond angles.

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